Quantum Imaging and Metrology
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Quantum Imaging and Metrology
Wed, 20/01/2016 - 14:30 to 15:30
Location:
Speaker:
Pieter Kok
Affiliation:
Sheffield University
Synopsis:
In this talk I will highlight some of the recent developments in quantum imaging and its relation to quantum metrology. I will describe imaging as a special kind of metrology, and explore how quantum coherence in multi-photon correlations can increase the imaging resolution. I will conclude with some open questions and future directions.